Overview

Elemental Range: Sulfur (S) to Uranium (U)

Applications: RoHS/halogen testing, metal/alloy composition, precious metals, coating thickness, mineral analysis.

Sample Types: Solids, powders, liquids, and thin films.

Analysis Time: Approximately 60 seconds per measurement.

Advantages: No sample destruction, minimal preparation, high repeatability, and user-friendly software interface.

Measurement Error

Precision: Typically ±0.5%–1% relative error for standard samples.

Detection Limit: Down to 1 ppm depending on the element and matrix.

Long-term Stability: ≤0.1% drift over 8 hours of continuous operation.

System Description

Detector: High-resolution Si-PIN semiconductor detector with electric cooling.

X-ray Tube: 5–50 kV adjustable high-voltage supply, long-life X-ray tube.

Collimator & Filters: Automatic switching for optimized measurement conditions.

Signal Processing: Digital multi-channel analyzer with high throughput.

Sample Chamber: Large, easily accessible chamber for a variety of sample sizes.

Control & Analysis Software: Advanced RoHS analysis software with automatic peak identification, quantitative analysis, matrix effect correction, and customizable calibration curves.